The report contains ten-year analysis with the following sections
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bruker nano | 291 |
veeco instruments | 53 |
veeco instr | 6 |
bruker axs microanalysis | 4 |
vutara | 3 |
raytheon company | 3 |
bruke nano | 2 |
brucker nano | 2 |
veeco metrology | 2 |
fagg, henry | 1 |
veeco instruments | 24 |
bruker axs microanalysis | 3 |
veeco instr | 1 |
bruker nano | 35 |
Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
method and apparatus of operating a scanning probe microscope | 47 | 2008 |
method and apparatus of operating a scanning probe microscope | 16 | 2009 |
low drift scanning probe microscope | 14 | 2010 |
closed loop controller and method for fast scanning probe microscopy | 13 | 2007 |
scanning probe microscope with compact scanner | 13 | 2011 |
method and apparatus of automatic scanning probe imaging | 12 | 2007 |
chemical nano-identification of a sample using normalized near-field spectroscopy | 12 | 2013 |
predicting led parameters from electroluminescent semiconductor wafer testing | 11 | 2011 |
scanning probe microscope having support stage incorporating a kinematic flexure arrangeā¦ 🛈 | 11 | 2009 |
fast-scanning spm and method of operating same | 10 | 2007 |