The report contains ten-year analysis with the following sections
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Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
probe card case and probe card transfer method | 18 | 2012 |
guide plate for probe guard and probe guard provided with same | 15 | 2012 |
electrical contact | 14 | 2012 |
semiconductor test system and relay driving test method therefor | 9 | 2008 |
guide plate for probe card | 9 | 2013 |
optical device inspecting apparatus | 8 | 2006 |
probe guide plate and method for manufacturing the same | 7 | 2013 |
probe card and method for manufacturing same | 6 | 2011 |
probe, probe card with probe mounted thereon, method for mounting probe on probe card an… 🛈 | 6 | 2008 |
probe guide, probe card, and method for probe guide manufacturing | 5 | 2016 |