The report contains ten-year analysis with the following sections
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Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
device for measuring level of molten metal and method thereof | 11 | 2008 |
multi-layer source/drain stressor | 8 | 2007 |
source/drain stressor and method therefor | 7 | 2007 |
systems and methods for space vector pulse width modulation switching using bootstrap ch… 🛈 | 7 | 2012 |
new resolution process of (s)-3-aminomethyl-5-methylhexanoic acid | 7 | 2008 |
method and device for measuring surface temperature of continuous casting ingot | 7 | 2007 |
transistor with differently doped strained current electrode region | 7 | 2007 |
a fan blade with holes | 6 | 2008 |
semiconductor process integrating source/drain stressors and interlevel dielectric layer… 🛈 | 5 | 2006 |
method of forming a semiconductor device using stress memorization | 4 | 2008 |