The report contains ten-year analysis with the following sections
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Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
methods and apparatus that selectively use or bypass a remote pin electronics block to t… 🛈 | 24 | 2007 |
flexible storage interface tester with variable parallelism and firmware upgradeability | 16 | 2010 |
method and apparatus for determining relevance values for a detection of a fault on a ch… 🛈 | 12 | 2008 |
methods for analyzing scan chains, and for determining numbers or locations of hold time… 🛈 | 11 | 2007 |
calibration module for a tester and tester | 10 | 2010 |
method of sharing a test resource at a plurality of test sites, automated test equipment… 🛈 | 10 | 2008 |
chip tester, method for providing timing information, test fixture set, apparatus for po… 🛈 | 10 | 2007 |
system, method and computer program for detecting an electrostatic discharge event | 9 | 2008 |
apparatus and method for estimating data relating to a time difference and apparatus and… 🛈 | 9 | 2008 |
tester, method for testing a device under test and computer program | 9 | 2006 |