The report contains ten-year analysis with the following sections
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snu precision company | 430 |
snu prec company | 14 |
umecha company | 8 |
snu prec co., ltd. (kr) | 3 |
sun precision company | 2 |
doosan mecatec company | 2 |
vitex systems | 2 |
sun prec company | 2 |
snu company | 1 |
se plasma | 1 |
snu precision company | 2 |
Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
vaporization apparatus and method for controlling the same | 12 | 2009 |
interferometer for tsv measurement and measurement method using same | 9 | 2011 |
substrate processing system having function for preventing damage | 9 | 2012 |
three-dimensional shape measuring device capable of measuring color information | 9 | 2013 |
apparatus for measuring thickness and method for measuring thickness using same | 8 | 2013 |
scanning electron microscope and method for measuring current of primary electrons, usin… 🛈 | 8 | 2011 |
depositing apparatus for forming thin film | 8 | 2011 |
apparatus for measuring three-dimensional profile using lcd | 8 | 2007 |
method for measuring thickness | 8 | 2008 |
apparatus for measuring thickness | 8 | 2008 |