The report contains ten-year analysis with the following sections
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Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
composite focused ion beam apparatus, and machining monitoring method and machining meth… 🛈 | 10 | 2007 |
thermal analyzer | 9 | 2010 |
charged particle beam apparatus and sample processing method | 8 | 2010 |
x-ray analyzer and x-ray analysis method | 8 | 2011 |
x-ray inspection device and x-ray inspection method | 8 | 2009 |
transmission x-ray analyzer | 8 | 2012 |
method for fabricating euvl mask | 7 | 2008 |
x-ray fluorescence analyzer and x-ray fluorescence analysis method | 7 | 2010 |
vorrichtung mit fokussiertem ionenstrahl | 7 | 2011 |
thermal analyzer | 7 | 2012 |