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nihon micronics | 1 |
Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
multilayer wiring board, manufacturing method therefor and probe card | 12 | 2012 |
inspektionsvorrichtung und inspektionsverfahren für licht emittierende vorrichtungen | 11 | 2011 |
probe card and inspection device | 10 | 2012 |
electrical connecting apparatus and testing system using the same | 10 | 2009 |
inspection unit, probe card, inspection device, and control system for inspection device | 10 | 2012 |
contact and electrical connecting apparatus using it | 10 | 2007 |
inspection apparatus for semiconductor devices and chunk stage used for the inspection a… 🛈 | 10 | 2011 |
apparatus for testing integrated circuit | 10 | 2009 |
probe assembly for inspecting power semiconductor devices and inspection apparatus using… 🛈 | 9 | 2011 |
multilayer wiring base plate and probe card using the same | 9 | 2012 |