The report contains ten-year analysis with the following sections
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sii nanotechnology | 11 |
seiko instruments | 1 |
Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
method for analyzing evolved gas and evolved gas analyzing apparatus | 12 | 2015 |
composite focused ion beam apparatus, and machining monitoring method and machining meth… 🛈 | 10 | 2007 |
iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron… 🛈 | 10 | 2013 |
repair apparatus | 10 | 2013 |
x-ray fluorescence analyzer | 9 | 2014 |
charged particle beam apparatus | 9 | 2014 |
automated sample-preparation device | 9 | 2014 |
sample holder and sample holder set | 8 | 2015 |
thermal analyzer | 8 | 2014 |
charged particle beam apparatus and sample processing method | 8 | 2010 |