The report contains ten-year analysis with the following sections
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cascade microtech | 46 |
suss microtec test systems | 13 |
cascade microtech | 35 |
cascade microtech dresden | 1 |
Title of patent family (most common patent title) |
Family members |
Filing year |
---|---|---|
high voltage chuck for a probe station | 12 | 2010 |
resilient electrical interposers, systems that include the interposers, and methods for … 🛈 | 9 | 2010 |
method for testing a test substrate under defined thermal conditions and thermally condi… 🛈 | 8 | 2007 |
wafer-handling end effectors | 8 | 2014 |
system for testing semiconductors | 8 | 2010 |
method and arrangement for positioning a probe card | 7 | 2007 |
systems and methods for simultaneous optical testing of a plurality of devices under test | 7 | 2010 |
systems and methods for providing wafer access in a wafer processing system | 7 | 2012 |
replaceable coupon for a probing apparatus | 7 | 2008 |
probe station with improved interconnection | 7 | 2010 |